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Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
Product Details
- Edition:
- 1.0
- Published:
- 11/07/2007
- Number of Pages:
- 123
- File Size:
- 1 file , 1.5 MB