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IEC 60444-11:2010 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.
Product Details
- Edition:
- 1.0
- Published:
- 10/07/2010
- Number of Pages:
- 28
- File Size:
- 1 file , 490 KB