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IEC 61280-2-2:2012 describes a test procedure to verify compliance with a predetermined waveform mask and to measure the eye pattern and waveform parameters such as rise time, fall time, modulation amplitude and extinction ratio.
Product Details
- Edition:
- 4.0
- Published:
- 10/25/2012
- Number of Pages:
- 56
- File Size:
- 1 file , 3.6 MB