Category: IEC

IEC

Posted in IEC

IEC 62783-1 Ed. 1.0 en:2019

Twinax cables for digital communications – Part 1: Generic specification
standard by International Electrotechnical Commission, 01/24/2019

Posted in IEC

IEC 61970-453 Ed. 1.0 en:2008

Energy management system application program interface (EMS-API) – Part 453: CIM based graphics exchange
standard by International Electrotechnical Commission, 06/24/2008

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IEC 61954 Ed. 2.0 b:2011

Static var compensators (SVC) – Testing of thyristor valves
standard by International Electrotechnical Commission, 04/21/2011

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IEC 63004 Ed. 1.0 en:2015

Standard for receiver fixture interface
standard by International Electrotechnical Commission, 12/14/2015

Posted in IEC

IEC 62246-1 Ed. 2.0 b:2011

Reed switches – Part 1: Generic specification
standard by International Electrotechnical Commission, 02/10/2011

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IEC 62007-1 Ed. 3.0 b:2015

Semiconductor optoelectronic devices for fibre optic system applications – Part 1: Specification template for essential ratings and characteristics
standard by International Electrotechnical Commission, 03/30/2015

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IEC 61907 Ed. 1.0 b:2009

Communication network dependability engineering
standard by International Electrotechnical Commission, 12/17/2009

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IEC 62899-201 Ed. 1.0 en:2016

Printed electronics – Part 201: Materials – Substrates
standard by International Electrotechnical Commission, 02/25/2016

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IEC 62724 Ed. 1.0 b:2013

Railway applications – Fixed installations – Electric traction – Insulating synthetic rope assemblies for support of overhead contact lines
standard by International Electrotechnical Commission, 12/04/2013

Posted in IEC

IEC 62137-1-2 Ed. 1.0 b:2007

Surface mounting technology – Environmental and endurance test methods for surface mount solder joint – Part 1-2: Shear strength test
standard by International Electrotechnical Commission, 07/25/2007

Posted in IEC

IEC 62372 Ed. 1.0 b:2006

Nuclear instrumentation – Housed scintillators – Measurement methods of light output and intrinsic resolution
standard by International Electrotechnical Commission, 02/23/2006

Posted in IEC

IEC 62047-8 Ed. 1.0 b:2011

Semiconductor devices – Micro-electromechanical devices – Part 8: Strip bending test method for tensile property measurement of thin films
standard by International Electrotechnical Commission, 03/14/2011