Category: JEDEC

TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION
standard by JEDEC Solid State Technology Association, 12/01/1996

Serial Interface for Data Converters
standard by JEDEC Solid State Technology Association, 12/01/2017

LOW FREQUENCY POWER TRANSISTORS
standard by JEDEC Solid State Technology Association, 01/01/1976

Inspection Criteria for Microelectronic Packages and Covers
standard by JEDEC Solid State Technology Association, 05/01/2011

NAND Flash Interface Interoperability
standard by JEDEC Solid State Technology Association, 10/01/2016

ADDENDUM No. 5 to JESD12 – DESIGN FOR TESTABILITY GUIDELINES
Amendment by JEDEC Solid State Technology Association, 08/01/1988

RECOMMENDED ESD TARGET LEVELS FOR HBM/MM QUALIFICATION
standard by JEDEC Solid State Technology Association, 08/01/2008

FBDIMM Architecture and Protocol
standard by JEDEC Solid State Technology Association, 01/01/2007

INDEX OF TERMS DEFINED IN JEDEC PUBLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2000

CMOS SEMICUSTOM DESIGN GUIDELINES
standard by JEDEC Solid State Technology Association, 11/01/1991

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 03/01/2009

Universal Flash Storage Host Controller Interface (UFSHCI)
standard by JEDEC Solid State Technology Association, 03/01/2016