BS DD ENV 50218:1996

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Documents the parametrized MOS test structures of the device model Parameter extraction Test Chip (PTC) of the European Mini Test Chip (ETC).

Cross References:
CENELEC R117-001
CENELEC R117-004
CENELEC R117-005
CENELEC R117-006
CENELEC R117-10
CENELEC prENV 50208-6
CENELEC ENV 50219

Product Details

Published:
09/15/1996
ISBN(s):
0580261794
Number of Pages:
26
File Size:
1 file , 1.1 MB
Product Code(s):
00824420, 00824420