Click here to purchase
Documents the parametrized test structures of the JESSI Reliability Test Chip (RTC) which is part of the European Mini Test Chip (ETC).
Cross References:
CENELEC Document Ref. No. R 117-001
PD 6595
CENELEC R 117-001
CENELEC R 117-005
CENELEC R 117-006
CENELEC R 117- ‘Description of a Parametrized European Mini Test Chip’
CENELEC R 117- ‘Data Interchange Format for Simulated and Measured Data (ISMD)’
CENELEC ‘R 117- Measurement Techniques of the Reliability Test Structures of the European Mini Test Chip’
CENELEC R 117- ‘Evaluation of the Reliability Test Structures of the European Mini Test Chip’
Product Details
- Published:
- 09/15/1996
- ISBN(s):
- 0580260372
- Number of Pages:
- 42
- File Size:
- 1 file , 980 KB
- Product Code(s):
- 00835677, 00835677, 00835677