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Specifies requirements for the data needed to describe the test and quality parameters of semiconductor die and gives recommendations for general industry good practice. To be read in conjunction with PD ES 59008-1:2000,PD ES 59008-3:1999
Cross References:
ES 59008-1:1999
ES 59008-2:1999
ES 59008-3:1999
ES 59008-6-1:1999
ES 59008-6-2
IEC 61360:1995
Product Details
- Published:
- 03/15/2001
- ISBN(s):
- 0580369722
- Number of Pages:
- 14
- File Size:
- 1 file , 190 KB
- Product Code(s):
- 19978917, 19978917, 19978917