BS PD IEC/TR 63133:2017

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BS PD IEC/TR 63133:2017 specifies a design technique of performance estimation storageelement, which can monitor semiconductor ageing and characterize ageing level. Theestimated ageing level can be used to improve the reliability of system.

Cross References:
IEEE 1149.1:2013

All current amendments available at time of purchase are included with the purchase of this document.

Product Details

Published:
01/29/2018
ISBN(s):
9780580988516
Number of Pages:
20
File Size:
1 file , 1.4 MB
Product Code(s):
30361972, 30361972, 30361972