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Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.
Product Details
- Edition:
- 3.0
- Published:
- 07/14/1993
- Number of Pages:
- 76
- File Size:
- 1 file , 3.7 MB