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This part of IEC 61280 is to describe a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask. This edition includes the following significant technical changes with respect to the previous edition:
– the necessity of DC coupling for extinction ratio measurement is clarified;
– the definition of extinction ratio has been revised to better harmonize with ITU-T; and
– the definition of OMA has been clarified.
Product Details
- Edition:
- 3.0
- Published:
- 03/11/2008
- Number of Pages:
- 53
- File Size:
- 1 file , 1.1 MB