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New IEEE Standard – Superseded.The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are deA?ned. This information can be broadly grouped into data that deA?nes the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe.
Product Details
- Published:
- 03/10/1999
- ISBN(s):
- 0738115533, 9780738115542
- Number of Pages:
- 108
- File Size:
- 1 file , 890 KB
- Product Code(s):
- STDSU94715